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X-ray detection of tiny defects in strongly scattered structures using the EMD method

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3 Author(s)
Fang-lin Chen ; Nat. Key Lab. for Electron. Meas. Technol., North Univ. of China, Taiyuan, China ; Li-ming Wang ; Yan Han

Non-destructive testing of polymer materials meets specific problems caused by strongly scattering of X-ray detection. When the expected flaws are very small, the information reflected by the flaws may be hidden in the gray-level oscillation caused by strongly scattered structures of polymer materials. For improved detection of defects in polymer materials, a new automatic detection approach based on the EMD (Empirical Modal Decomposition) method, including a new algorithm that using IE (Information Entropy) and PSNR (Peak Signal to Noise Ratio) to control EMD optimal decomposition is proposed. The experimental investigations demonstrated a good performance of the proposed technique in the case of strongly scattering polymer sample. At the same time, it is suitable for all types of defect detection.

Published in:

Image and Signal Processing (CISP), 2010 3rd International Congress on  (Volume:3 )

Date of Conference:

16-18 Oct. 2010