By Topic

Exploring the rogue wave phenomenon in 3D power distribution networks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Xiang Hu ; ECE Dept., Univ. of California, San Diego, CA, USA ; Peng Du ; Chung-Kuan Cheng

This paper discusses the electrical characteristics of power distribution networks (PDNs) in 3DICs on both system and chip level. In the system-level analysis the global resonance effects in 3D PDNs are highlighted. For chip-level analysis, detailed metal-layer-based power grid model is proposed for the first time for 3D PDNs. With the detailed power grid model, local resonance effects that are unique to 3D PDNs are revealed. The spatial and temporal impacts of distributed current sources on the time-domain noise of 3D PDNs are also explored based on the multi-source worst-case noise calculation algorithm. Simulation results demonstrate the “Rogue Wave” phenomenon in 3D PDNs.

Published in:

Electrical Performance of Electronic Packaging and Systems (EPEPS), 2010 IEEE 19th Conference on

Date of Conference:

25-27 Oct. 2010