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Generating test data with enhanced context-free grammars

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1 Author(s)
Maurer, P.M. ; Univ. of South Florida, Tampa, FL, USA

The use of context-free grammars to improve functional testing of very-large-scale integrated circuits is described. It is shown that enhanced context-free grammars are effective tools for generating test data. The discussion covers preliminary considerations, the first tests, generating systematic tests, and testing subroutines. The author's experience using context-free grammars to generate tests for VLSI circuit simulators indicates that they are remarkably effective tools that virtually anyone can use to debug virtually any program.<>

Published in:

Software, IEEE  (Volume:7 ,  Issue: 4 )

Date of Publication:

July 1990

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