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Shear-force atomic force microscope by using the second resonance regime of tuning fork probe

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5 Author(s)
Liu, Zhuang ; Singapore Institute of Manufacturing Technology, 71 Nanyang Drive, Singapore 638075 ; Ying Zhang ; Shaw Wei Kok ; Ng, Boon Ping
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3518057 

An imaging scheme of shear-force atomic force microscope is proposed by exploiting the second resonance regime of the tuning fork probe. Theoretical analysis and experimental results demonstrate that the imaging scheme can deliver better sensitivity and higher resolution of topographic imaging.

Published in:

Applied Physics Letters  (Volume:97 ,  Issue: 19 )

Date of Publication:

Nov 2010

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