Cart (Loading....) | Create Account
Close category search window
 

Performance analysis of frequency-hopped packet radio networks with side information generated from test symbols

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mohamed, K.A. ; Dept. of Electr. Eng., Fac. of Eng., Tripoli, Libya ; Pap, L.

This paper is concerned with the performance analysis of frequency-hopped packet radio networks with erasure only decoding. Reliable side information is generated by inserting a special group of test symbols in each dwell. Although the primary use of test symbols is to ensure reliable side information, it has the additional potential benefit of making data symbols capable of discriminating partial overlaps. Closed form expressions for packet capture probabilities are derived for random and one-coincidence hopping patterns. Numerical results indicate that, increasing the number of test symbols leads to a significant improvement in the throughput at high traffic levels

Published in:

Spread Spectrum Techniques and Applications Proceedings, 1996., IEEE 4th International Symposium on  (Volume:3 )

Date of Conference:

22-25 Sep 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.