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Enhanced interferometric technique for non-destructive characterization of crystalline optical materials: automated express refractive index measurements

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3 Author(s)
Karbovnyk, I.D. ; Ivan Franko Nat. Univ. of Lviv, Lviv, Ukraine ; Andrushchak, N.A. ; Bobitskii, Y.V.

We report an enhanced experimental set-up that allows fast and accurate determination of refractive indexes in optical materials. The set-up is equipped with the high-precision sample positioning system and sensitive detector for the registration of interference fringes shift. Additionally, an approach that can be utilized in order to eliminate the error caused by non-parallel sample edges is discussed. The results of the refraction index measurements in lithium niobate are presented.

Published in:

Advanced Optoelectronics and Lasers (CAOL), 2010 International Conference on

Date of Conference:

10-14 Sept. 2010