Cart (Loading....) | Create Account
Close category search window

Reconstruction of two-dimensional permittivity distribution using the distorted Born iterative method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chew, W.C. ; Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA ; Wang, Y.M.

The distorted Born iterative method (DBIM) is used to solve two-dimensional inverse scattering problems, thereby providing another general method to solve the two-dimensional imaging problem when the Born and the Rytov approximations break down. Numerical simulations are performed using the DBIM and the method proposed previously by the authors (Int. J. Imaging Syst. Technol., vol.1, no.1, p.100-8, 1989) called the Born iterative method (BIM) for several cases in which the conditions for the first-order Born approximation are not satisfied. The results show that each method has its advantages; the DBIM shows faster convergence rate compared to the BIM, while the BIM is more robust to noise contamination compared to the DBIM

Published in:

Medical Imaging, IEEE Transactions on  (Volume:9 ,  Issue: 2 )

Date of Publication:

Jun 1990

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.