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The development of a simple TRL microstrip calibration and test fixture suitable for measurements at cryogenic temperatures

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2 Author(s)
van Niekerk, C. ; Dept. of Electr. & Electron. Eng., Stellenbosch Univ., South Africa ; Meyer, P.

The development of a TRL (thru/reflect/line) calibration and test fixture for vector network analyser measurements of microwave transistors at cryogenic temperatures, is presented. While capable of withstanding the severe environmental changes incurred by cooling to low temperatures, the fixture is simpler than similar existing fixtures. Measurements are presented to illustrate the repeatability of the fixture

Published in:

AFRICON, 1996., IEEE AFRICON 4th  (Volume:2 )

Date of Conference:

24-27 Sep 1996