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The analysis and measurement of frequency selective surfaces

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3 Author(s)
Davidson, D.B. ; Dept. of Electr. & Electron. Eng., Stellenbosch Univ., South Africa ; Smith, A.G. ; Van Tonder, J.J.

This paper discusses recent progress on the analysis and measurement of frequency selective surfaces (FSS). The finite difference time domain (FDTD) method is used for the analysis of the structures and measurements are made in a free-space system using a focused Gaussian beam. The extensions required for extending the FDTD method to analyzing periodic structures are reviewed. Computed and measured results are presented and compared for a variety of cases, including both normal and off-normal incidence. Good agreement has been obtained. Parametric studies are reported. Some problems encountered are discussed

Published in:

AFRICON, 1996., IEEE AFRICON 4th  (Volume:2 )

Date of Conference:

24-27 Sep 1996

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