By Topic

Worst-Case Induced Disturbances in Digital and Analog Interchip Interconnects by an External Electromagnetic Plane Wave—Part I: Modeling and Algorithm

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Lagos, J.L. ; Electron. Dept., Politec. di Torino, Torino, Italy ; Fiori, F.

This paper deals with the susceptibility of electronic units to radiated electromagnetic (EM) interference and specifically, it focuses on the parasitic coupling of EM fields with printed circuit board interconnects like microstrip lines. To this purpose, a uniform lossless microstrip line illuminated by an EM plane wave is considered and the voltages at the line terminations are evaluated referring to the Baum-Liu-Tesche equations. Based on this, a new algorithm to identify, frequency-by-frequency, the incidence angles and the polarization of the impinging field that gives rise to the maximum induced voltages at the line terminations is presented.

Published in:

Electromagnetic Compatibility, IEEE Transactions on  (Volume:53 ,  Issue: 1 )