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Realization of a built-in self-test for integrated circuits based on reconfiguration

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1 Author(s)
Mosin, S.G. ; Vladimir State Univ., Vladimir, Russia

The solution of built-in self-test based on Oscillation-BIST concept and oriented on usage together with analog and mixed-signal IC and taking into account tolerances on parameters of analog subcircuits' internal components has been proposed. The main attention has been paid to architecture of testing subcurcuit, realization of measurement circuit and the estimating oscillated frequency of circuit under test. The experimental results have been described for second-order active filter.

Published in:

Actual Problems of Electron Devices Engineering (APEDE), 2010 International Conference on

Date of Conference:

22-23 Sept. 2010