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Paper cut-out pattern recognition based on wavelet moment invariants

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4 Author(s)
Xiaoyun Wang ; Coll. of Math. & Comput. Sci., Yangtze Normal Univ., Chongqing, China ; Xianquan Zhang ; Guoxiang Li ; Fangyuan Qin

Wavelet moment features of image can reflect the image's part and whole characteristics and have strong anti-jamming ability. We use wavelet moments extracted from Paper-cut patterns to get multi-scale features. Combined with the paper-cut images' characteristics, the different mean and standard deviation of eigenvector are used to compute resolution and produce N class model feature selection. Finally, the eigenvectors are sent to nearest neighbor classifier for recognition. Experiments show that this method is effective in distinguishing paper cut-cut patterns with noise contamination or geometric deformation.

Published in:

Computer Application and System Modeling (ICCASM), 2010 International Conference on  (Volume:15 )

Date of Conference:

22-24 Oct. 2010