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A design of attitude indicator based on mems technology

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4 Author(s)
Li Wen-qiang ; North Univ. of China, Taiyuan, China ; Ma Fu-chang ; Zhang Ying-mei ; Yang Lu

This paper introduces a new design of attitude indicator based on MEMS technology. It analyzes the principle of testing attitude by acceleration sensor, the conditioning circuit, calculation and scale transform. It also gives a method which can realize by MMA7260 to measure the biaxial acceleration signal. Using inner ADC of ATmega16, collecting and converting conditioned signals, as well as the precision of the system improved from 10 bits to 14 bits based on the technique of oversampling. The experimental results show that the attitude indicator has the measuring range of dual spindle: ±90°, precision: ±1°, meets design requirements.

Published in:

Computer Application and System Modeling (ICCASM), 2010 International Conference on  (Volume:6 )

Date of Conference:

22-24 Oct. 2010