Scheduled System Maintenance:
On Wednesday, July 29th, IEEE Xplore will undergo scheduled maintenance from 7:00-9:00 AM ET (11:00-13:00 UTC). During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Research on criminal tool wear based on multi-scale fractal feature of the texture image

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mou Li ; Dept. of Comput. Sci. & Technol., Guangdong Police Coll., Guang Zhou, China ; Yang Min

In forensic science, the wear information of the criminal tool can provide the relevant cues. So far, the researches about how to analyze the wear of criminal tool are still in the initial stage. There is a strong relationship between the degree of wear for the cutting tool such as pliers and the geometry imparted by the tool on to the wire surface. It is more practical and helpful to analyze the mark surface left in the crime scene for getting the information about the tool and the criminal. This paper discusses our work, which involves multi-scale fractal analysis for the texture of the mark surface. Multi-scale fractal features of the mark texture images are computed for analyzing the wear of the tool. Our result shows that the multi-scale fractal features can be effectively used to analyze the wear of the cutting tool.

Published in:

Computer Application and System Modeling (ICCASM), 2010 International Conference on  (Volume:8 )

Date of Conference:

22-24 Oct. 2010