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An improved outlier detection algorithm based on frequent pattern

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2 Author(s)
Guang Min Liang ; Sch. of Electron. & Inf. Eng., Shenzhen Polytech., Shenzhen, China ; Wang Shuguang

This paper focuses on the outlier detection algorithm based on frequent pattern (FP method). First we analyze the drawback of FP method, and then present an improved method (LFP method). Finally, we evaluate the two methods by using several datasets and the experiment results show that the LFP method outperforms the FP method in outlier detection.

Published in:

Computer Application and System Modeling (ICCASM), 2010 International Conference on  (Volume:7 )

Date of Conference:

22-24 Oct. 2010