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Variability analysis of a digitally trimmable ultra-low power voltage reference

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4 Author(s)
Mingoo Seok ; EECS, University of Michigan Ann Arbor, MI, USA ; Gyouho Kim ; David Blaauw ; Dennis Sylvester

A digitally trimmable voltage reference is proposed, achieving a tight distribution of temperature coefficient and output voltage, along with pA-range current consumption for Vdd=0.5-3.0V. Using 2 temperature point digital trimming, the temperature coefficient and nominal output voltage are within 5.3-47.4ppm/°C and 175.2-176.5mV across 25 dies in 0.13μm CMOS. Non-trimmable versions are also implemented in 0.13μm and 0.18μm technologies to study process variations across multiple runs and technology portability of the design.

Published in:

ESSCIRC, 2010 Proceedings of the

Date of Conference:

14-16 Sept. 2010