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Cross Comparison Guide for Results of Neutron SEE Testing of Microelectronics Applicable to Avionics

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2 Author(s)
Normand, E. ; Boeing Res. & Technol., Seattle, WA, USA ; Dominik, L.

A cross comparison of SEU, SEFI and SEL responses in >30 devices (SRAMs μprocessors and FPGAs) using different neutron/proton beams leads to observation that SEU and SEFI cross sections from 14 MeV neutrons are within <;2 compared to LANL neutron beam.

Published in:

Radiation Effects Data Workshop (REDW), 2010 IEEE

Date of Conference:

20-23 July 2010

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