Close category search window
 

Scheduling uniform parallel machines with machine eligibility restrictions to minimize total weighted tardiness

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ying Guo ; Sch. of Manage., Hefei Univ. of Technol., Hefei, China ; Xinbao Liu

This paper considers the problem of scheduling uniform parallel machines with machine eligibility restrictions to minimize total weighted tardiness. We presented a new heuristic algorithm based local search on each machine for this problem. The experimental results have shown that the proposed heuristic was a very effective method for this problem in terms of solution quality, computational expense, coding complexity and algorithm stability, as seen through a comparison of 6 algorithms on various pairs of test data. Moreover, we observed that the proposed algorithm can be extended to the unrelated parallel machine setting.

Published in:
Computer Application and System Modeling (ICCASM), 2010 International Conference on  (Volume:8 )

Date of Conference: 22-24 Oct. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.