Cart (Loading....) | Create Account
Close category search window
 

Numerical simulation of propagation and defect reflection of T(0,1) mode guided wave in pipes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Jiao Yang ; Inst. of Inf. Sci. & Eng., Hebei Univ. of Sci. & Technol., Shijiazhuang, China ; Sun Guangkai ; Li Guanghai ; Zhao Yubo
more authors

For the complexity of calculating and analyzing the guided wave propagation and defect reflection in steel pipes, and the instructional role on studying the characters of T(0,1) mode guided wave to experimental studies, a method associating guided wave theory with numerical solution was applied to simulate T(0,1) mode guided wave propagation and defect reflection in steel pipes by building models, imposing surface loads, and calculating in the ANSYS program, and the characters of T(0,1) mode guided wave were studied. The results of numerical calculation prove that: the T(0,1)mode guided wave was basically non-dispersive in reasonable frequencies, the attenuation trend of amplitude was exponential and the amplitude was basically keeping stable after propagating some distance, the T(0,1) mode guide wave was sensitive to both inner and outer circumferential defects. The reflection coefficient of T(0,1) mode guided wave increases linearly with the increase of circumferential length and depth of defects. When defect depth is not through-thickness, axial length has more influence on reflection coefficient. When defect depth is through-thickness, the influence of axial length to reflection coefficient is basically omitted.

Published in:

Computer Application and System Modeling (ICCASM), 2010 International Conference on  (Volume:3 )

Date of Conference:

22-24 Oct. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.