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Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency

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6 Author(s)
Fenning, D.P. ; Lab. for Photovoltaic Res., Massachusetts Inst. of Technol., Cambridge, MA, USA ; Hofstetter, J. ; Bertoni, M.I. ; Lelievre, J.F.
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Synchrotron-based X-ray fluorescence microscopy is applied to study the evolution of iron silicide precipitates during phosphorus diffusion gettering and low-temperature annealing. Heavily Fe-contaminated ingot border material contains FeSi2 precipitates after rapid in-line P-diffusion firing, suggesting kinetically limited gettering in these regions. An impurity-to-efficiency (I2E) gettering model is developed to explain the results. The model demonstrates the efficacy of high- and medium-temperature processing on reducing the interstitial iron population over a range of process parameters available to industry.

Published in:

Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE

Date of Conference:

20-25 June 2010