By Topic

New method suitable for relative short distance measurement

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Karel Hoffmann ; Dpt. Electromagnetic Field, Faculty of Electrical Eng., Czech Technical University in Prague, Technicka 2, 166 27 Praha 6, Czech Republic ; Zbynek ┼ákvor

A new method for relative short distance measurement of reflective surfaces was designed. The relative distance is derived from a frequency where two interfering coherent signals (one is reflected from the measured object, the second is a reference one) create a sharp signal minimum. The viability of the method was preliminary experimentally verified in X-band. Potential possibilities of the method were tested by software simulation. Sub-micron distance resolution in industrial applications can be supposed.

Published in:

Microwave Conference (EuMC), 2010 European

Date of Conference:

28-30 Sept. 2010