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Miniature dual six-port millimeter-wave network analyzer on alumina ceramic substrate

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5 Author(s)
Haddadi, K. ; Inst. d''Electron., de Microelectron. et de Nanotechnol., Villeneuve d''Ascq, France ; Wang, M.M. ; Ziouche, K. ; Glay, D.
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This paper presents a dual six-port network analyzer suitable for the measurement of the reflection and the transmission coefficients of a device under test in the frequency band 59-61 GHz. The millimetre-wave part is implemented on a thin alumina ceramic substrate associated to non-biased Schottky diodes for power detection. The proposed system is realized and the different tests performed demonstrate the validity of this alternative for millimetre-wave measurements.

Published in:
Microwave Conference (EuMC), 2010 European

Date of Conference: 28-30 Sept. 2010

Page(s):
1564 - 1567
Print ISBN:
978-1-4244-7232-1
INSPEC Accession Number:
11627998
Conference Location :
Paris
Product Type:
Conference Publications

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