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This paper presents a dual six-port network analyzer suitable for the measurement of the reflection and the transmission coefficients of a device under test in the frequency band 59-61 GHz. The millimetre-wave part is implemented on a thin alumina ceramic substrate associated to non-biased Schottky diodes for power detection. The proposed system is realized and the different tests performed demonstrate the validity of this alternative for millimetre-wave measurements.
Microwave Conference (EuMC), 2010 European
Date of Conference: 28-30 Sept. 2010