By Topic

Magnetically insulated baffled probe for real-time monitoring of equilibrium and fluctuating values of space potentials, electron and ion temperatures, and densities

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Demidov, V.I. ; Department of Physics, West Virginia University, Morgantown, West Virginia 26506, USA ; Koepke, M.E. ; Raitses, Y.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

By restricting the electron-collection area of a cold Langmuir probe compared to the ion-collection area, the probe floating potential can become equal to the space potential, and thus conveniently monitored, rather than to a value shifted from the space potential by an electron-temperature-dependent offset, i.e., the case with an equal-collection-area probe. This design goal is achieved by combining an ambient magnetic field in the plasma with baffles, or shields, on the probe, resulting in species-selective magnetic insulation of the probe collection area. This permits the elimination of electron current to the probe by further adjustment of magnetic insulation which results in an ion-temperature-dependent offset when the probe is electrically floating. Subtracting the floating potential of two magnetically insulated baffled probes, each with a different degree of magnetic insulation, enables the electron or ion temperature to be measured in real time.

Published in:

Review of Scientific Instruments  (Volume:81 ,  Issue: 10 )