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Using a synthetic bus test instrument to reduce program costs

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2 Author(s)
Hoover, R.L. ; Teradyne, Inc., North Reading, MA, USA ; Heide, C.

This paper illustrates how serial buses have been emulated in the past and how, using synthetic bus technology, better test methods can reduce program life cycle costs.

Published in:

AUTOTESTCON, 2010 IEEE

Date of Conference:

13-16 Sept. 2010