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Results of X-band electronically scanned array using an overlapped subarray architecture

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4 Author(s)
Duffy, S.M. ; MIT Lincoln Lab. Lexington, Lexington, MA, USA ; Willwerth, F. ; Retherford, L. ; Herd, J.S.

The measured results from an X-band electronically scanned array using an overlapped subarray architecture are presented. The 2D architecture uses a 12×12 element subarray with 3 to 1 overlapping. The active electronic scanned array is a receive only implementation consisting of switch, low noise amplifier, phase shifter and attenuator. Measured far-field patterns and excitation at the aperture using near-field scanner demonstrates desired design goals of a 20 degree sector beam with low sidelobes. Finally, the scan performance of the sector subarray beam is measured at 20 and 40 degrees. A three tile implementation is constructed and measured.

Published in:

Phased Array Systems and Technology (ARRAY), 2010 IEEE International Symposium on

Date of Conference:

12-15 Oct. 2010