Cart (Loading....) | Create Account
Close category search window
 

Multiple-frequency imaging using a terahertz quantum cascade laser

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Saat, N.K. ; Sch. of Electron. & Electr. Eng., Univ. of Leeds, Leeds, UK ; Dean, P. ; Khanna, S.P. ; Salih, M.
more authors

We describe a multiple-frequency imaging system based on an electrically-tunable terahertz (THz) frequency quantum cascade laser (QCL). The transverse resolution of the system was measured using gold-on-quartz resolution targets, and shown to remain unchanged as the radiation wavelength increased. This was explained through measurement of the far-field emission profile of the QCL. Using this imaging system we determined the attenuation coefficients of the high-explosive pentaerythritol tetranitrate (PETN), together with a number of other polycrystalline materials, at five frequencies, and compared these results with those obtained using both THz time domain spectroscopy and high-resolution Fourier-transform infrared spectroscopy.

Published in:

Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on

Date of Conference:

5-10 Sept. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.