Cart (Loading....) | Create Account
Close category search window
 

Ship Detection in Ice-Infested Waters Based on Dual-Polarization SAR Imagery

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Brekke, C. ; Dept. of Phys. & Technol., Univ. of Tromso, Tromsø, Norway ; Anfinsen, S.N.

This letter discusses the potential of automatic ship detection in ice-infested waters based on satellite synthetic aperture radar (SAR) imagery. The popular K -distribution is used to model the backscatter statistics of sea ice clutter. The goodness of fit of this model is assessed with the Kolmogorov-Smirnov and Anderson-Darling test statistics for both VV and VH polarizations. We also test the impact of introducing the Method of Log Cumulant (MoLC) estimator for the shape parameter of the K-distribution. Finally, a constant false-alarm rate ship detection algorithm, applying the K -distribution with the MoLC estimator, is evaluated on dual-polarization RADARSAT-2 SAR data. Our results demonstrate that this is a viable approach to ship detection in ice-infested waters.

Published in:

Geoscience and Remote Sensing Letters, IEEE  (Volume:8 ,  Issue: 3 )

Date of Publication:

May 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.