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The effect of mechanical stress on the dielectric constant of is experimentally studied. A beam-bending method is used to extract the strain effect coefficient M12. According to the measurements, the dielectric constant changes linearly with the stress. The value of is shown to be -(0.19 ± 0.01) × 10-21 m2/V2. The mechanism underlying the phenomena is discussed.
Date of Publication: Dec. 2010