By Topic

Effect of Correlated Nakagami-m Fading on the ε-Outage Channel Capacity of the Decentralized Two-Relay Network

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yifan Chen ; Sch. of Electr., Electron. & Comput. Eng., Newcastle Univ., Newcastle upon Tyne, UK ; Cong Ling

Using an infinite-series representation of the bivariate Nakagami-m distribution, the cumulative distribution function (cdf) of channel capacity of the decentralized two-relay network (DTRN) is derived. Subsequently, the ϵ-outage channel capacity can be computed. Based on the theoretical results, we define the forbidden zone of correlation, within which the overall channel capacity is drastically reduced by correlated Nakagami fading. Furthermore, the general expression of the outage capacity is also applicable to any other fading statistics. The analysis presented in this paper should provide useful insight on the placement of cooperative relays in the DTRN.

Published in:

Wireless Communications, IEEE Transactions on  (Volume:9 ,  Issue: 12 )