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In this paper, the matching-on-in-order time-domain volume-surface integral equation (MOO TD-VSIE) method is utilized to analyze electromagnetic scattering from objects composed of both conductor and dielectric material. SWG and RWG basis functions are used as the spatial basis functions in volume and surface discretization respectively. Different orders of weighted Laguerre polynomials are used as temporal basis functions and the relative expansion coefficients are solved recursively order by order. The spatial and temporal testing procedures are separate, and both of them are performed with the Galerkin's method. Numerical results are given to verify the proposed method.