Cart (Loading....) | Create Account
Close category search window
 

Ontology matching and verification system using concept description translation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Letia, I.A. ; Dept. of Comput. Sci., Tech. Univ. of Cluj-Napoca, Cluj-Napoca, Romania ; Pop, O.

The integration of multiple ontologies and also the interaction between entities using different ontologies is one of the major challenges of the Semantic Web, ontologies play a crucial role in information representation. Significant research effort is directed towards aligning ontologies and identifying matching concepts. In this paper we present a novel method of concept translation and mapping using bridging rules by replacing a concept through an equivalent representation named bag of concepts. By translating concept description between ontologies we obtain the equivalent representation of the same concept using terms from other ontology, which will be used to determine the mapped concept or verify existing ones.

Published in:

Intelligent Computer Communication and Processing (ICCP), 2010 IEEE International Conference on

Date of Conference:

26-28 Aug. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.