Cart (Loading....) | Create Account
Close category search window

Blocking artifact reduction of DCT coded image sequences using a visually adaptive postprocessing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Derviaux, C. ; Dept. O.A.E., Valenciennes Univ., France ; Coudoux, F.-X. ; Gazalet, M.G. ; Corlay, P.

The blocking effect is known to be the major degradation in block based video compression techniques. In this paper, we describe an adaptive postprocessing algorithm for the reduction of blocking effect in video coded sequences. It is based on a visual model for the prediction of blockiness visibility. The postfiltering operation is based on a 3D adaptive filter. A space-variant spatial filter is first used to smooth the pixels at block boundaries where the blocking effect is highly visible. It is followed by motion compensated nonlinear filtering in the temporal domain. Experimental results are presented showing that the proposed algorithm can remove the blocking effect while keeping image sharpness

Published in:

Image Processing, 1996. Proceedings., International Conference on  (Volume:1 )

Date of Conference:

16-19 Sep 1996

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.