By Topic

Multifractal analysis for texture characterization: A new approach based on DWT

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Ouahabi, A. ; Ecole Polytech., Signal & Image Group, Univ. de Tours, Tours, France

Texture characterization, which measures the fluctuations of image amplitude regularity in space, now often uses fractal and multifractal analysis. The present contribution deals with a multifractal approach in ultrasound skin images to characterize melanoma. In this paper, we propose to build new hierarchical multiresolutions quantities: Maximum coefficients of the Discrete Wavelet Transform for 2D Multifractal analysis. The performance of the proposed texture descriptors was evaluated for 2D synthetic processes and biomedical texture classification.

Published in:

Information Sciences Signal Processing and their Applications (ISSPA), 2010 10th International Conference on

Date of Conference:

10-13 May 2010