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Heavy Ion Testing With Iron at 1 GeV/amu

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24 Author(s)
Jonathan A. Pellish ; Radiation Effects and Analysis Group, NASA/GSFC Code 561.4, Greenbelt, MD, USA ; Michael A. Xapsos ; Kenneth A. LaBel ; Paul W. Marshall
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A 1 GeV/amu 56Fe ion beam allows for true 90° tilt irradiations of various microelectronic components and reveals relevant upset trends at the GCR flux energy peak. Three SRAMs and an SRAM-based FPGA evaluated at the NASA Space Radiation Effects Laboratory demonstrate that a 90° tilt irradiation yields a unique device response. These tilt angle effects need to be screened for, and if found, pursued with radiation transport simulations to quantify their impact on event rate calculations.

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IEEE Transactions on Nuclear Science  (Volume:57 ,  Issue: 5 )