Cart (Loading....) | Create Account
Close category search window
 

Similarities and differences in the analytical descriptions of the acceleration sensitivities of acoustic bulk and surface wave resonators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Tiersten, H.F. ; Dept. of Mech. Eng. & Areonaut. Eng. & Mech., Rensselaer Polytech. Inst., Troy, NY, USA

The importance and advantages of the use of finite deformation theory in the analytical description of the influence of biasing states in general and acceleration in particular on the accurate prediction of the behavior of precision resonant devices is noted. The unknown intermediate biasing state is defined and the electroelastic equations are presented referred to the known reference coordinates. The useful equation for the perturbation in eigenfrequency was obtained from these equations. The detailed mode shapes of both surface wave and contoured resonators are presented, as are the equations of the extension and flexure of thin plates for the determination of the biasing states. Some results on acceleration sensitivity for both surface wave and contoured resonators are presented and contrasted

Published in:

Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.

Date of Conference:

5-7 Jun 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.