Close category search window
 

An Improved Maximum Relevance and Minimum Redundancy Feature Selection Algorithm Based on Normalized Mutual Information

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
La The Vinh ; Dept. of Comput. Eng., Kyung Hee Univ., Yongin, South Korea ; Nguyen Duc Thang ; Young-Koo Lee

We present in this paper a comprehensive analysis of the mutual information based feature selection algorithms. We point out the limitations of some recent work in this area then propose an improvement to overcome the weak points. The experiment results confirm that we achieve a better feature sets compared with the two recent developed algorithms, which are Maximum Relevance and Minimum Redundancy (mRMR) and Normalized Mutual Information Feature Selection (NMIFS), in terms of the classification accuracy.

Published in:
Applications and the Internet (SAINT), 2010 10th IEEE/IPSJ International Symposium on

Date of Conference: 19-23 July 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.