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Analysis of a multistage interconnection network using binary decision diagrams (BDD)

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2 Author(s)
Jian Chiu ; Nat. Semicond. Corp., Arlington, TX, USA ; Bechta Dugan, J.

The authors use the BDD to help derive a closed-form solution for the reliability of a multistage interconnection network with n stages. The BDD reveals repeated structures, the reliability of which can be encoded in a recursive formula. An exact solution of a network with an arbitrary number of stages can be computed in time proportional to the number of stages. They also provide results which include the concept of imperfect coverage, in which two mutually-exclusive failure modes (with different effects) are possible for certain switching elements

Published in:

Reliable Distributed Systems, 1996. Proceedings., 15th Symposium on

Date of Conference:

23-25 Oct 1996

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