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Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily

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3 Author(s)
Golonek, T. ; Inst. of Electron., Silesian Univ. of Technol., Gliwice, Poland ; Grzechca, D. ; Rutkowski, J.

This paper describes the technique dedicated to an analog integrated circuit testing by means of supply current monitoring. The minimal set of test points, that allows to achieve the highest possible fault coverage, is determined with the use of genetic algorithm. Thanks to the proposed dynamic scheme of phenotype coding, the optimization process is more efficient than for a standard, static genotype structure realization.

Published in:

Signals and Electronic Systems (ICSES), 2010 International Conference on

Date of Conference:

7-10 Sept. 2010