Close category search window
 

Continuous separation of non-magnetic particles through negative magnetophoresis inside ferrofluids

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Taotao Zhu ; Dept. of Chem., Univ. of Georgia, Athens, GA, USA ; Marrero, F. ; Leidong Mao

We present a simple, low-cost, effective, and label-free continuous flow non-magnetic microparticle separation scheme in a microfluidic device under static magnetic fields. The separation process is based on negative magnetophoresis and uses water-based ferrofluids. We exploit the difference in particle sizes to achieve continuous binary separation of fluorescent microparticles with high throughput and efficiency. We demonstrate size-based separation (2.1 μm and 9.9 μm; 2.1 μm and 4.8 μm) of microparticles with close to 100% separation efficiency and a minimum of 10 particles/hour throughput. This new approach opens the door for the development of label-free continuous cellular separation in microfluidic devices with high throughput, efficiency, and reliability.

Published in:
Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on

Date of Conference: 20-23 Jan. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.