By Topic

Special Target Recognition and Location Using Differential Image Detection Technology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Xiao Luo ; Sch. of Mechatronical Eng., Beijing Inst. of Technol., Beijing, China ; Qingsheng Luo ; Baoling Han ; Cai Gao

It is well known that the special objectives such as military cave storage is hard to be recognized and located by routine method because of camouflage technology. This paper presents a new algorithm basing on differential image detection and edge detection technology. Firstly, extracting some target images at different period while in the same position. Then using preprocessing technology to define the object region for analyzed. The third, adopting differential detection algorithm for image comparison, filtering the noise which may influence detection results by setting proper gray threshold. After excluding the interference factors such as working environment, phenophase, experimental instrument, light condition and so on, we can determine the shape feature of target's boundary. Experimental results demonstrate that this algorithm can realize fast processing, high accuracy recognition, insensitive to the noise and is effective for increasing the capability of special target recognition and location such as military cave storage.

Published in:

Intelligent Human-Machine Systems and Cybernetics (IHMSC), 2010 2nd International Conference on  (Volume:2 )

Date of Conference:

26-28 Aug. 2010