By Topic

Dynamic L-I characteristics measurement of laser diodes for analyzing intermodulation distortion mechanism

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Yamada, H. ; Kansai Electron. Res. Lab., NEC Corp., Otsu, Japan ; Okuda, T. ; Torikai, T. ; Uji, T.

A novel dynamic light-output versus current (L-I) characteristics measurement is proposed for analyzing intermodulation distortion in CATV link laser diodes (LDs). A good correlation is found between the dynamic L-I characteristics and the intermodulation distortion characteristics in LDs, enabling us to analyze the distortion mechanism in the LDs.

Published in:

Semiconductor Laser Conference, 1996., 15th IEEE International

Date of Conference:

13-18 Oct. 1996