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A proportional hazards approach to correlate SiO2-breakdown voltage and time distributions

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1 Author(s)
Chan, C.K. ; AT&T Bell Lab., Whippany, NJ, USA

A new relationship for correlatingtime-to-breakdown and voltage-to-breakdown distributions is derived within the framework of proportional hazards models. The relationship is used to analyze the silicon dioxide breakdown data of D. Wolters, T. Hoogestyn, and H. Kraaij (WHK) (in The Physics of MOS Insulators, p.349-52, 1980). From the WHK data, the acceleration factor for every 1 MV/cm change in the applied electric field is estimated to be 100.7 at 300°C. The relationship can be used to estimate quickly the electric-field acceleration factor, using the time-to-breakdown data measured at one fixed voltage and the voltage-to-breakdown data measured at a single voltage ramp rate

Published in:

Reliability, IEEE Transactions on  (Volume:39 ,  Issue: 2 )

Date of Publication:

Jun 1990

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