Cart (Loading....) | Create Account
Close category search window

Noise Performance Evaluation of Uncooled Infrared Detectors (June 2009)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Oloomi, H.M. ; Dept. of Eng., Indiana Univ.-Purdue Univ. Fort Wayne, Fort Wayne, IN, USA ; Alam, M.S. ; Rana, M.M.

In this paper, we considered the issues related to modeling and analysis of uncooled infrared detectors noise analysis utilizing pulse train equalization technique. We first developed a mathematical model appropriate for the noise performance study of the detector and then derive the detectivity and noise equivalent temperature difference (NETD) expressions for the predetection, detection, and postdetection noise sources. Our study of the postdetection noise sources was focused on the capacitive transimpedance amplifier unit cell electronics which provides a tight control over the detector bias current and handles a lower background radiation with a superior noise performance. We developed a parametric tradeoff study which provides a guide for optimizing the bolometer noise performance through the adjustment of detector parameters. We also discussed the use of scanning format and time-delay integration technique for improving the performance of multiple arrays of detectors.

Published in:

Sensors Journal, IEEE  (Volume:11 ,  Issue: 4 )

Date of Publication:

April 2011

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.