By Topic

An effective 3-D finite element scheme for computing electromagnetic field distortions due to defects in eddy-current nondestructive evaluation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Z. Badics ; Nucl. Fuel Ind. Ltd., Osaka, Japan ; Y. Matsumoto ; K. Aoki ; F. Nakayasu
more authors

A new three-dimensional (3-D) finite element scheme for eddy-current nondestructive evaluation (NDE) problems is described that calculates directly the perturbation of the electromagnetic field due to defects in metallic specimens. The computational costs of such problems are usually very high using available finite element schemes, and the new scheme is supposed to lower these costs. The basic concept, the direct calculation of the field distortion due to the flaw, is provided for rather general defects, but the detailed finite element scheme is discussed for zero-conductivity flaws. The source terms of the formulation are determined from the unperturbed field, and the impedance change due to a defect can be calculated as an integral over the flaw. A finite element scheme for solving problems with crack-type defects is also presented as a limiting case of the formulation for zero-conductivity flaws. Solutions of a benchmark problem from the testing electromagnetic analysis methods (TEAM) workshop series (problem number 15/2) and of tube problems with artificial slots are presented and compared to experimental data

Published in:

IEEE Transactions on Magnetics  (Volume:33 ,  Issue: 2 )