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A decision support system of statistical process control for printed circuit boards manufacturing

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4 Author(s)
Hsin Rau ; Dept. of Ind. & Syst. Eng., Chung Yuan Christian Univ., Chungli, Taiwan ; Chien-Hung Wu ; Wei-Jung Shiang ; Po-Tsang Huang

This study develops a decision support system for printed circuit board (PCB) inner layer fabrication, which includes defect inspection system and statistical process control (SPC) system. The defect inspection system is capable of automatically inspecting ten types of defects in the etching process in order to maintain the quality of product. The SPC system is to detect process problems, when process is out of control. In this study, five common process problems can be recognized by the SPC system. With the help of these two systems, people can make better decisions during the manufacturing processing.

Published in:

Machine Learning and Cybernetics (ICMLC), 2010 International Conference on  (Volume:5 )

Date of Conference:

11-14 July 2010