Cart (Loading....) | Create Account
Close category search window
 

Imaging of multinuclear spin system (I>1/2) in semiconductor microstructures using longitudinal-magnetization-detection nuclear magnetic resonance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kawamura, Takashi ; Department of Physics, Tohoku University, Sendai 980-8578, Japan ; Yusa, Go

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3490673 

We propose a method for detecting the local nuclear spin in semiconductor microstructures using a nuclear magnetic resonance technique that detects the longitudinal magnetization (Mz) of nuclear spins. This technique involves manipulating the nuclear spin by applying a particular sequence of pulsed gradient and homogeneous magnetic fields. By calculating the time evolution of the density operators, we demonstrate that the local change in magnetization can be extracted from the change in the magnetization of the whole system. This technique is suitable for investigating microscopic semiconductor systems with a multinuclear spin of I>1/2.

Published in:

Applied Physics Letters  (Volume:97 ,  Issue: 11 )

Date of Publication:

Sep 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.