Cart (Loading....) | Create Account
Close category search window
 

The Influence of Project Cost Produced by Knowledge Sharing on Information Systems Integration Based on KAC Model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
You Jing ; Chongqing Univ. of Sci. & Technol., Chongqing, China

From the view of knowledge accumulation, knowledge accumulation cost (KAC) model is built in information systems integration project. With this model, get conclusion that high knowledge sharing would be helpful for project cost controlling, and on condition of fixed knowledge sharing degree higher information systems integration innovation introduces higher project cost, while higher study capability makes it lower. Further more, when innovation degree for integration is high controlling project cost would demand high knowledge sharing, on the contrary when study capability is high knowledge sharing gives little influence on project cost. Then application case is introduced and this conclusion is used in getting some action for project cost controlling.

Published in:

Management and Service Science (MASS), 2010 International Conference on

Date of Conference:

24-26 Aug. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.