By Topic

Space-Charge Plane-Wave Interaction at Semiconductor Substrate Boundary

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ibrahim A. Elabyad ; Microwave and Communication Engineering, University of Magdeburg ?Otto von Guericke?, Magdeburg, Germany ; Mohamed S. Eldessouki ; Hadia M. El-Hennawy

A theoretical investigation of space-charge plane-wave interaction at dielectric-semiconductor interfaces is presented. A full-wave and charge transport formulation is applied to the analysis of the fundamental mode of propagation in a semiconductor substrate backed with a ground plane. Closed-form expressions for the field components, charge carrier density, and current density are obtained. The reflection coefficients for both H- and E-polarized incident waves were then derived from the field solutions. The interaction between the fields and charge carriers causes a charge accumulation at the semiconductor surface in the case of H-polarization. The effects of the charge accumulation on the reflection coefficient are accounted for. Results indicate that the space charge exerts a weak effect on the reflection coefficient and a strong screening effect on the normal component of the electric field. The tangential component, however, is mainly governed by energy dissipation effect resulting from the conduction current.

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:58 ,  Issue: 10 )