Polarized small-angle neutron scattering has been used to measure the magnetic structure of a CoCrPt–SiOx thin-film data storage layer, contained within a writable perpendicular recording media, at granular (<10 nm) length scales. The magnetic contribution to the scattering is measured as the magnetization is reversed by an external field, providing unique spatial information on the switching process. A simple model of noninteracting nanomagnetic grains provides a good description of the data and an analysis of the grain-size dependent reversal provides strong evidence for an increase in magnetic anisotropy with grain diameter.
Published in:
Applied Physics Letters
(Volume:97
,
Issue:
11
)
Date of Publication:
Sep 2010
- Page(s):
-
112503
-
112503-3
- ISSN :
-
0003-6951
- Digital Object Identifier :
-
10.1063/1.3486680
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
16 September 2010
- Issue Date :
-
Sep 2010