Cart (Loading....) | Create Account
Close category search window
 

CMOS interleaved distributed 2 × 3 matrix amplifier employing active post distortion and optimum gate bias linearization technique

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
El-Khatib, Z. ; Dept. of Electron., Carleton Univ., Ottawa, ON, Canada ; MacEachern, L. ; Mahmoud, S.A.

In this paper, the design of a fully-integrated CMOS interleaved distributed 2 × 3 matrix amplifier employing active post distortion and optimum gate bias linearization technique that allows for broadband distortion reduction is presented. Simulation results has yielded a peak S21 power gain of 7.1 dB and then rolls off to a unity gain bandwidth of 16 GHz with less than -10 dB return loss and S12 Isolation less than -45 dB. The simulation results show a 9 dBm IIP3 improvement corresponding to a third-order intermodulation IM3 suppression of 18 dB improvement at output power of -10 dBm. The proposed linearized interleaved distributed 2 × 3 matrix amplifier was designed using the 0.13 μm CMOS technology.

Published in:

Electrical and Computer Engineering (CCECE), 2010 23rd Canadian Conference on

Date of Conference:

2-5 May 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.